ID-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off-axis Fresnel Zone Plates

F. Poring; F. Marschall; Z. Yin; B. Rosner; M. Beye; P. Miedema; K. Kubicek; L. Glaser; D. Raiser; J. Soltau; V.A. Guzenko; J. Viefhaus; J. Buck; M. Risch; S. Techert; C. David

doi:10.1017/s1431927618013260

journal article·2018-08Open access

ID-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off-axis Fresnel Zone Plates

F. Poring, F. Marschall, Z. Yin, B. Rosner, M. Beye, P. Miedema, K. Kubicek, L. Glaser, D. Raiser, J. Soltau, V.A. Guzenko, J. Viefhaus, J. Buck, M. Risch, S. Techert, C. David

Microscopy and Microanalysis· Volume 24· Issue S2

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Abstract

F Doring, F Marschall, Z Yin, B Rosner, M Beye, P Miedema, K Kubicek, L Glaser, D Raiser, J Soltau, VA Guzenko, J Viefhaus, J Buck, M Risch, S Techert, C D

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis

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References (3)

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1. 10.1038/s41598-017-09052-010.1038/s41598-017-09052-0 ↗

2. 10.1103/RevModPhys.83.70510.1103/RevModPhys.83.705 ↗

3. J. Synchrotron Radiat. · 2014 · 8 · 736