An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
Source abstract
Abstract
Hamed Safaie, Ria L Mitchell, Richard Johnston, James Russell, Cameron Pleydell-Pearce; An Assessment of Polarized Light Microscopy for the Quantification
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Microstructure and mechanical properties · Adhesion, Friction, and Surface Interactions
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References (4)
Show source-provided references
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4. Materials Science and Engineering · 2001 · A319 · 409