Material Discrimination at High Spatial Resolution using Sub-300eV X-rays
Source abstract
Abstract
P Statham, J Sagar, S Burgess, J Holland; Material Discrimination at High Spatial Resolution using Sub-300eV X-rays, Microscopy and Microanalysis, Volume 2
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced X-ray and CT Imaging · X-ray Spectroscopy and Fluorescence Analysis · Electron and X-Ray Spectroscopy Techniques
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References (7)
Show source-provided references
1. 10.1017/S143192761700986210.1017/S1431927617009862 ↗
2. IOP Conf. Series: Materials Science and Engineering · 2017 · 304 · 012010
3. 10.1017/S143192761600141010.1017/S1431927616001410 ↗
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5. Microscopy Today · 2017 · 2 · 20
6. 10.1017/S143192761400514510.1017/S1431927614005145 ↗
7. JEOL News · 2012 · 47 · 23