On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex
Source abstract
Abstract
Abstract In this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Near-Field Optical Microscopy · Surface and Thin Film Phenomena
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