Analytical Spatial Resolution in EPMA: What is it and How can it be Estimated?
Source abstract
Abstract
Aurelien Moy, John Fournelle; Analytical Spatial Resolution in EPMA: What is it and How can it be Estimated?, Microscopy and Microanalysis, Volume 23, Issu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1017/S155192951300051510.1017/S1551929513000515 ↗
2. Fournelle J et al, IOP Conf. Series: Materials Science and Engineering 109 (2016).10.1088/1757-899X/109/1/012003 ↗
3. Moy A & Fournelle J Microscopy and Microanalysis ((this conference).
4. 10.1007/s00604005005210.1007/s006040050052 ↗