Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images
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Abstract
Chenyu Zhang, Benjamin Berkels, Benedikt Wirth, Paul M Voyles; Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmissi
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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References (6)
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1. 10.1038/ncomms515510.1038/ncomms5155 ↗
2. 10.1103/PhysRevLett.96.09610610.1103/PhysRevLett.96.096106 ↗
3. Research at UW-Madison (CZ and PMV) was supported by the US Department of Energy (DE-FG02-08ER46547). Research at RWTH (BB) was supported by the Excellence Initiative of the German Federal and State Government. Research at Munster (BW) was supported by the Alfried Krupp Prize for Young University Teachers awarded by the Alfried Krupp von Bohlen und Halbach-Stiftung..
4. 10.1016/j.ultramic.2013.12.00410.1016/j.ultramic.2013.12.004 ↗
5. 10.1186/s40679-015-0008-410.1186/s40679-015-0008-4 ↗
6. Berkels B. & Wirth B. https://arxiv.org/abs/1612.08170 2016.