DataVXMicroscopy and MicroanalysisPaper
journal article·2017-07

Aberration-Corrected STEM/EELS at Cryogenic Temperatures

Lena F. Kourkoutis, Ismail El Baggari, Benjamin H. Savitzky, David J. Baek, Berit H. Goodge, Robert Hovden, Michael J. Zachman

Microscopy and Microanalysis· Volume 23· Issue S1
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Abstract

Lena F Kourkoutis, Ismail El Baggari, Benjamin H Savitzky, David J Baek, Berit H Goodge, Robert Hovden, Michael J Zachman; Aberration-Corrected STEM/EELS a
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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Electron and X-Ray Spectroscopy Techniques

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References (4)

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1. 10.1073/pnas.160604411310.1073/pnas.1606044113 ↗
2. 10.1038/ncomms446410.1038/ncomms4464 ↗
3. We acknowledge support from AFOSR (FA 9550-16-1-0305), NSF MRI award (DMR-1429155), and the Packard Foundation. Work made use of CCMR facilities supported by NSF (DMR-1120296).
4. 10.1126/science.114882010.1126/science.1148820 ↗