Rapid Tomography in Environmental TEM: How Fast Can We Go to Follow the 3D Evolution of Nanomaterials in situ?
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Abstract
Lucian Roiban, Sid Koneti, Khan Tran, Yue-Meng Feng, Thomas Grenier, Voichita Maxim, Thierry Epicier; Rapid Tomography in Environmental TEM: How Fast Can W
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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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1. This work is performed within the framework of the French ANR project n°15-CE09-0009-01 "3DCLEAN" http://www.clym.fr/3DCLEAN_web/3DCLEAN-ANR.html). The authors thank the CLYM (Consortium Lyon-Saint Etienne de Microscopie, www.clym.fr) for the access to the microscope and A. Paczad (Gatan USA) for the loan of the Oneview camera. Colleagues having provided samples are gratefully acknowledged: A.S. Gay from IFPen (Solaize, F) for Pd@Al2O3, A. Serve and P. Vernoux from Ircelyon (Villeurbanne, F) for soot@ZrO2. M. Aouine (Ircelyon) and F. Dalmas (MATEIS) are thanked for useful discussions and experimental contributions to this work.