High Resolution Electron Microscopy of Grain Boundary Motion During Island Grain Shrinkage
Source abstract
Abstract
U Dahmen, T Radetic, ML Bowers, C Ophus, A Gautam, F Lançon; High Resolution Electron Microscopy of Grain Boundary Motion During Island Grain Shrinkage, Mi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Microstructure and mechanical properties · Microstructure and Mechanical Properties of Steels · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1021/nl903885p10.1021/nl903885p ↗
2. 10.1016/j.actamat.2011.12.01310.1016/j.actamat.2011.12.013 ↗
3. 10.1016/j.actamat.2012.09.01210.1016/j.actamat.2012.09.012 ↗