Exploring Differences in Amorphous Layer Formation during FIB Sample Preparation between Metals and Non Metals
Source abstract
Abstract
Michael Presley, Jacob Jensen, Dan Huber, Hamish Fraser; Exploring Differences in Amorphous Layer Formation during FIB Sample Preparation between Metals an
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1017/S143192760201009710.1017/S1431927602010097 ↗
2. 10.1093/jmicro/dfh08010.1093/jmicro/dfh080 ↗