journal article·2016-07Open access

Development of a Reference Material for Image Sharpness Evaluation in Scanning Electron Microscopy

Kazuhiro Kumahai, Akira Kurokawa

Microscopy and Microanalysis· Volume 22· Issue S3

Abstract

Kazuhiro Kumahai, Akira Kurokawa; Development of a Reference Material for Image Sharpness Evaluation in Scanning Electron Microscopy, Microscopy and Microa
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques

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References (1)

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1. Microsc. Microanal · 2015 · 21 · 223910.1017/S1431927615011976 ↗