Hybrid SEM/AFM System from Carl Zeiss Revolutionizes Analysis of Functional Micro- and Nanostructured Specimen
Source abstract
Abstract
Nils Anspach, Frank Hitzel, Fang Zhou, Soeren Eyhusen; Hybrid SEM/AFM System from Carl Zeiss Revolutionizes Analysis of Functional Micro- and Nanostructure
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques
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