Focused Ion Beam (FIB) Microscopy and Technology
Source abstract
Abstract
P E Russell, F A Stevie; Focused Ion Beam (FIB) Microscopy and Technology, Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 558–559,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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