Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM
Source abstract
Abstract
Abstract A decade ago, a statistics-based method was introduced to count the number of atoms from annular dark-field scanning transmission electron microscopy (ADF STEM) images. In the past years, this method was successfully applied to nanocrystals of arbitrary shape, size, and composition (and its high accuracy and precision has been demonstrated). However, the counting results obtained from this statistical framework are so far presented without a visualization of the actual uncertainty about this estimate. In this paper, we present three approaches that can be used to represent counting results together with their statistical error, and discuss which approach is most suited for further use based on simulations and an experimental ADF STEM image.
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
EMAT, University of Antwerp , Antwerp , Belgium
NANOlab Center of Excellence, University of Antwerp , Antwerp , Belgium
I-BioStat, Data Science Institute, Hasselt University , Hasselt , Belgium
Funding
Universiteit Antwerpen · Fonds Wetenschappelijk Onderzoek · H2020 European Research Council
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