Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions
Source abstract
Abstract
Xiangli Zhong, Xiaorong Zhou, Sarah J Haigh, Philip J Withers, M Grace Burke; Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions, Micros
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
University of Manchester Department of Materials,
Oak Ridge National Laboratory
References (5)
Show source-provided references
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2. Bassim · J. Microsc · 2012 · 245 · 28810.1111/j.1365-2818.2011.03570.x ↗
3. Zhong · J. Microsc · 2020 · 110.1111/jmi.12983 ↗
4. Michael · 2011
5. Mayer · MRS Bull · 2007 · 32 · 40010.1557/mrs2007.63 ↗