An Improved FIB Sample Preparation Technique for Site-specific Plan-view Specimens: A New Cutting Geometry
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
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References (1)
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1. 10.1016/j.ultramic.2017.09.01110.1016/j.ultramic.2017.09.011 ↗