Fast electron low dose tomography for beam sensitive materials
Source abstract
Abstract
Daniel Arenas Esteban, Hans Vanrompay, Alexander Skorikov, Armand Béché, Johan Verbeeck, Bert Freitag, Sara Bals; Fast electron low dose tomography for bea
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
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3. [7] The authors would like to thank Professor Maarten Roeffaers for the provision of the samples.
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5. Fast Electron Tomography for Nanomaterials10.1021/acs.jpcc.0c08939 ↗
6. Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges10.1016/j.ultramic.2020.113191 ↗
7. Phase contrast STEM for thin samples: Integrated differential phase contrast10.1016/j.ultramic.2015.10.011 ↗