Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector

Ryusuke Sagawa; Hiroki Hashiguchi; Thomas Isabell; Robert Ritz; Martin Simson; Martin Huth; Heike Soltau; Gerardo T. Martinez; Peter D. Nellist; Yukihito Kondo

doi:10.1017/s1431927618001484

journal article·2018-08Open access

Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector

Ryusuke Sagawa, Hiroki Hashiguchi, Thomas Isabell, Robert Ritz, Martin Simson, Martin Huth, Heike Soltau, Gerardo T. Martinez, Peter D. Nellist, Yukihito Kondo

Microscopy and Microanalysis· Volume 24· Issue S1

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Abstract

Ryusuke Sagawa, Hiroki Hashiguchi, Thomas Isabell, Robert Ritz, Martin Simson, Martin Huth, Heike Soltau, Gerardo T Martinez, Peter D Nellist, Yukihito Kon

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Crystallography and Radiation Phenomena

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