IPrep – Automated Serial-Section Broad-Ion-Beam Tomography
Source abstract
Abstract
T Hosman, S Coyle, A Abbott, M Olvera, M Hassel-Shearer, JA Hunt; IPrep – Automated Serial-Section Broad-Ion-Beam Tomography, Microscopy and Microanalysis,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (1)
Show source-provided references
1. 10.1016/j.ultramic.2015.11.00110.1016/j.ultramic.2015.11.001 ↗