4D-STEM Imaging With the pnCCD (S)TEM-Camera

M. Simson; H. Ryll; H. Banba; R. Hartmann; M. Huth; S. Ihle; L. Jones; Y. Kondo; K. Muller; P.D. Nellist; R. Sagawa; J. Schmidt; H. Soltau; L. Striider; H. Yang

doi:10.1017/s1431927615011836

journal article·2015-08Open access

4D-STEM Imaging With the pnCCD (S)TEM-Camera

M. Simson, H. Ryll, H. Banba, R. Hartmann, M. Huth, S. Ihle, L. Jones, Y. Kondo, K. Muller, P.D. Nellist, R. Sagawa, J. Schmidt, H. Soltau, L. Striider, H. Yang

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

M Simson, H Ryll, H Banba, R Hartmann, M Huth, S Ihle, L Jones, Y Kondo, K Muller, PD Nellist, R Sagawa, J Schmidt, H Soltau, L Striider, H Yang; 4D-STEM I

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (3)

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1. 10.1016/0304-3991(93)90105-710.1016/0304-3991(93)90105-7 ↗

2. Appl. Phys. Lett. · 2012 · 101 · 2121101

3. Microscopy and Microanalysis · 2013 · 19 · 116010.1017/S1431927613007794 ↗