Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction

Arantxa Vilalta-Clemente; Jun Jiang; Ben Britton; David M Collins; Angus Wilkinson

doi:10.1017/s1431927615010235

journal article·2015-08Open access

Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction

Arantxa Vilalta-Clemente, Jun Jiang, Ben Britton, David M Collins, Angus Wilkinson

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

Arantxa Vilalta-Clemente, Jun Jiang, Ben Britton, David M Collins, Angus Wilkinson; Analysis of Dislocation Densities using High Resolution Electron Backsc

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Microstructure and mechanical properties · Non-Destructive Testing Techniques · Welding Techniques and Residual Stresses

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