Q.U.A.I.N.T.P.E.A.X. QUantifying Algorithmically INTrinsic Properties of Electronic Assemblies via X-ray CT
Source abstract
Abstract
John True, Nathan Jessurun, Dhwani Mehta, Navid Asadi; Q.U.A.I.N.T.P.E.A.X. QUantifying Algorithmically INTrinsic Properties of Electronic Assemblies via X
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Memory and Neural Computing · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (20)
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