Rapid and Semi-Automated Analysis of 4D-STEM data via Unsupervised Learning
Source abstract
Abstract
Chuqiao Shi, Michael Cao, David Muller, Yimo Han; Rapid and Semi-Automated Analysis of 4D-STEM data via Unsupervised Learning, Microscopy and Microanalysis
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
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References (4)
Show source-provided references
1. Jesse · Sci Rep-uk · 2016 · 6
2. Lee · Nano Lett · 2020 · 20
3. Han · Nano Letters · 2018 · 18 · 374610.1021/acs.nanolett.8b00952 ↗
4. Jiang · Nature · 2018 · 559 · 34310.1038/s41586-018-0298-5 ↗