Quantitative Electron-excited X-ray Microanalysis with Low Energy L-Peaks
Source abstract
Abstract
Dale Newbury, Nicholas Ritchie; Quantitative Electron-excited X-ray Microanalysis with Low Energy L-Peaks, Microscopy and Microanalysis, Volume 26, Issue S
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advancements in Photolithography Techniques
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References (6)
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1. 10.1017/S143192761901482X10.1017/S143192761901482X ↗
2. 10.1017/S143192761900296410.1017/S1431927619002964 ↗
3. 10.1007/978-1-4939-6676-910.1007/978-1-4939-6676-9 ↗
4. 10.1017/S143192761601183110.1017/S1431927616011831 ↗
5. 6. Ritchie, N. (2018). NIST DTSA-II software, including tutorials. Available for free at: http://www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.html (retrieved December 19, 2019).
6. 1. Castaing, R. , Ph. D. Thesis, “Application of electron probes to local chemical and crystallographic analysis,” University of Paris (1951).