Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography
Source abstract
Abstract
Fengshan Zheng, Vadim Migunov, Jan Caron, Hongchu Du, Giulio Pozzi, Rafal E Dunin-Borkowski; Three-dimensional electric field mapping of an electrically bi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. 10.1063/1.161487210.1063/1.1614872 ↗
2. J. Caron , Ph.D. Thesis, RWTH Aachen University, 2017.
3. 10.1016/0304-3991(92)90039-M10.1016/0304-3991(92)90039-M ↗
4. The authors acknowledge the European Union for funding through the Marie Curie Initial Training Network Grant No. 606988 under FP7-PEOPLE-2013-ITN).
5. 10.1017/S143192761700012510.1017/S1431927617000125 ↗
6. 10.1088/0034-4885/71/1/01610210.1088/0034-4885/71/1/016102 ↗
7. 10.1146/annurev-matsci-070511-15500710.1146/annurev-matsci-070511-155007 ↗