Plasma FIB Spin Milling for Large Volume Serial Sectioning Tomography
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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Advanced X-ray Imaging Techniques
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References (10)
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1. Blavettea · Euro. Physical Journal - Applied Physics · 2014 · 68 · 1
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10. 10.1557/mrs2008.12410.1557/mrs2008.124 ↗