Dose-efficient strain mapping with high precision and throughput using cepstral transforms on 4D-STEM data
Source abstract
Abstract
K P Harikrishnan, Dasol Yoon, Yu-Tsun Shao, Luigi Mele, Christoph Mitterbauer, David Muller; Dose-efficient strain mapping with high precision and throughp
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
1. Tate · Microsc. Microanal · 2016 · 22 · 23710.1017/S1431927615015664 ↗
2. Cooper · Nano Lett · 2015 · 15 · 528910.1021/acs.nanolett.5b01614 ↗
3. Ozdol · Appl. Phys. Lett · 2015 · 10610.1063/1.4922994 ↗
4. Müller · Appl. Phys. Lett · 2012 · 101 · 21211010.1063/1.4767655 ↗
5. Yuan · Ultramicroscopy · 2019 · 207 · 11283710.1016/j.ultramic.2019.112837 ↗
6. Padgett · Ultramicroscopy · 2020 · 214 · 11299410.1016/j.ultramic.2020.112994 ↗