To the reliability of x-ray texture measurements: Important parameters, measuring strategies, scatter bands and comparative measurements with different systems

The dependency of x-ray texture measurements from several important hardware parameters is shown. The consequences of different usual measuring strategies onto the resulting ODF are presented and the efficiency of the used correction method is investigated. A new 2-dimensional correction routine is developed as well as a new selfcorrection test for the quality judgement of the correction method. Scatter bands of one measurement, one goniometer system and in comparison of different goniometer systems are presented. Therefore comparative measurements of a textureless specimen and a specimen with a texture beneficial for deep drawing have been carried out at five different european laboratories. The results show, that some institutes work with correction methods that do not match to the used measuring strategy and that the comparison of measurements at different laboratories is very delicate due to the great differences in the determined textures.