PLSR-based surface damaged layer depth determination of sawed natural diamond

The damaged layer depth of sawed natural diamond is an important factor for evaluating the quality of the sawed surface, however, it is difficult to determine. To measure the layer depth quickly and accurately, sawed natural diamond surfaces with low roughness are obtained in this studuy. A roughness measuring instrument, scanning electron microscope, x-ray diffractometer, and other equipment are used to characterize and analyse the sawed surface. The results show that a cut surface with acceptable quality can be obtained by sawing natural diamond. They also show that a part of the sawed natural diamond has been transformed into amorphous carbon and carbon allotropes in the damaged layer. Based on these observations, the damaged layer depth is experimentally measured. A new methord, based on x-ray diffraction and partial least squares regression , which quickly and accurately determines the damaged layer depth, is proposed. This method provides an effective means for evaluating the quality of sawed diamond surfaces.