Thickness controlled nanostructure formation in RF sputtered WS2 thin film
Source abstract
Abstract
Thickness controlled nanostructure formation in RF sputtered WS2 thin film, Yarbrough, Kelsea A, Pradhan, Sangram K, Kogo, Gilbert, Roul, Monee, Lin, Pengtao, Zhang, Kai, Baumgart, Helmut, Bahoura, Messaoud
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: 2D Materials and Applications · Chalcogenide Semiconductor Thin Films · MXene and MAX Phase Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (32)
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