journal article·1982-11

A high resolution dilatometer for in situ studies of the electrointercalation of layered materials

W. Biberacher, A. Lerf, J.O. Besenhard, H. Möhwald, T. Butz

Materials Research Bulletin· Volume 17· Issue 11
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OpenAlex topics: Semiconductor materials and interfaces · Chemical Synthesis and Characterization · 2D Materials and Applications

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References (18)

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16. J. O. Besenhard, H. Möhwald, W. Biberacher, in preparation
17. W. Biberacher, J. O. Besenhard, T. Butz, A. Hübler, A. Lerf, H. Möhwald, in preparation
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