Effect of substrate temperature on structural and linear and nonlinear optical properties of nanostructured PLD a-SiC thin films
Source abstract
Abstract
Abstract In this paper, the effect of substrate temperatures (Ts) on the structural, linear and non-linear optical properties of nanostructured amorphous Silicon Carbide (a-SiC) thin films deposited onto fused silica by pulsed-laser deposition technique is reported. The structural and compositional properties were studied by X-ray diffraction, Raman spectroscopy and Fourier transform Infrared spectroscopy. A transition from Silicon-rich SiC to nearly stoichiometric SiC was observed with increasing Ts. The absorption coefficient (α), refractive index (n), optical band gap and thickness of the films were determined from UV–vis-IR spectra. Static refractive indices of the films were found to vary from 2.99–2.54 with the increasing Ts. The optical band gap of the films was found to be increasing from 1.5 eV to 2.33 eV with increase in Ts. The third order non-linear optical susceptibility (χ(3)) of the a-SiC thin films estimated from Z-scan studies was found to be of the order of 10−3 esu.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Diamond and Carbon-based Materials Research · Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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