Novel synthesis of hafnium oxide nanoparticles by precipitation method and its characterization
Source abstract
Abstract
Abstract Hafnium oxide nanoparticles (HfO 2 NPs) have been successfully synthesized by means of a novel precipitation method and were characterized by using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Field emission scanning electron microscopy (FESEM), UV–visible, Fourier transform infrared (FTIR) and laser Raman spectroscopy. The XRD and Raman analysis revealed the presence of pure monoclinic HfO 2 NPs. FESEM image showed that the HfO 2 NPs were of spherical shape with an average particle size of about 20 nm. The optical band gap of the HfO 2 NPs was found to be 6.12 eV. Advantages of this method were simple and low cost of synthesis of HfO 2 NPs includes the small and narrow particle size distribution.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (29)
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