Structural, XPS and magnetic studies of pulsed laser deposited Fe doped Eu2O3 thin film
Source abstract
Abstract
Abstract Fe (4 at.%) doped europium (III) oxide thin film was deposited on silicon (1 0 0) substrate by pulsed laser deposition technique. Structural, spectral and magnetic properties were studied by X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and magnetization measurements. XRD and Raman spectroscopy reveal that the grown film is single phased and belongs to the cubic structure of Eu 2 O 3 . XPS study of the Eu 1.92 Fe 0.08 O 3 film shows that Fe exists in Fe 3+ ionic state in the film. The film exhibits magnetic ordering at room temperature.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Magnetic and transport properties of perovskites and related materials · Electronic and Structural Properties of Oxides · Advanced Condensed Matter Physics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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