journal article·2026-06

Defect Dynamics in Phosphorus-implanted Si(100) under Swift Heavy Ion Irradiation: X-ray Photoelectron Spectroscopy

Monika Verma, Priyal Singhal, Ramcharan Meena, Sanjeev Gautam

Materials Letters· Volume 412
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OpenAlex topics: Ion-surface interactions and analysis · Silicon and Solar Cell Technologies · X-ray Spectroscopy and Fluorescence Analysis

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