Micro void detection and quantification in Al-Mg alloy by application of quantum dot luminescence
Source abstract
Abstract
Abstract Facile methods for detection of micro voids in the early stages of ductile fracture in structural alloys do not exist. In this work an application of Quantum Dot Luminescence (QDL) for detection of micro-voids from sub-micro-meter levels in an Al-Mg alloy is reported for the first time. The ability of QDL with fluorescence microscopy for extended detection of micro-voids is shown by comparative imaging with optical and SEM in the necked region of miniature tensile samples of Al-Mg. Micro voids in the size range 0.2 – 10 µm using QDL were detected. Thus, the novel method of characterising damage using QDL provides quantitative insights about degradation phenomena from its incipience in alloys for load bearing applications.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Surface Polishing Techniques · Non-Destructive Testing Techniques
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References (11)
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