Electronic properties of nanostructured metal films: the evolution of Anderson singularity index with size

Abstract The results of X-ray photoelectron spectroscopy studies of thin monodispersed Mo and Ni metal nanocluster films deposited with magnetron sputtering method onto silicon dioxide surfaces are presented. The dependence of X-ray photoelectron spectra asymmetry of the core lines of the films on typical sizes of nanoclusters in films are studied. It is found experimentally that the Anderson singularity index α changes differently for different materials with decreasing of nanocluster’s size. It is shown that Seebeck coefficient of Ni nanocluster films consisted of 1.5 nm sized nanoclusters can reach 100 μ V/K.