journal article·2013-02-04Open access

Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM

Xiaoxing Ke, Carla Bittencourt, Sara Bals, Gustaaf Van Tendeloo

Abstract

Focused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, demonstrating that the Pt nanoclusters are well-dispersed, covering the selected areas of the CNT surface completely. The ability of FEBID to graft nanoclusters on multiple sides, through an electron-transparent target within one step, is unique as a physical deposition method. Using high-resolution TEM we have shown that the CNT structure can be well preserved thanks to the low dose used in FEBID. By tuning the electron-beam parameters, the density and distribution of the nanoclusters can be controlled. The purity of as-deposited nanoclusters can be improved by low-energy electron irradiation at room temperature.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (46)

Show source-provided references
1. 10.1146/annurev.matsci.33.012802.10025510.1146/annurev.matsci.33.012802.100255 ↗
2. 10.1016/j.cplett.2008.07.08210.1016/j.cplett.2008.07.082 ↗
3. 10.1016/j.carbon.2009.02.00210.1016/j.carbon.2009.02.002 ↗
4. 10.1002/cphc.20090019310.1002/cphc.200900193 ↗
5. 10.1016/j.cplett.2012.03.04510.1016/j.cplett.2012.03.045 ↗
6. 10.1021/nn901595510.1021/nn9015955 ↗
7. 10.1021/nn101183y10.1021/nn101183y ↗
8. 10.1038/nnano.2010.12910.1038/nnano.2010.129 ↗
9. 10.1002/adma.20050018110.1002/adma.200500181 ↗
10. 10.1080/1040843060093043810.1080/10408430600930438 ↗
11. 10.3762/bjnano.3.7010.3762/bjnano.3.70 ↗
12. 10.1063/1.297758710.1063/1.2977587 ↗
13. 10.1116/1.295572810.1116/1.2955728 ↗
14. 10.1002/anie.20100267710.1002/anie.201002677 ↗
15. 10.1016/j.susc.2010.10.03510.1016/j.susc.2010.10.035 ↗
16. 10.1016/j.mee.2007.12.03610.1016/j.mee.2007.12.036 ↗
17. 10.1155/2009/93686310.1155/2009/936863 ↗
18. 10.3762/bjnano.3.6210.3762/bjnano.3.62 ↗
19. 10.1088/1367-2630/11/3/03303210.1088/1367-2630/11/3/033032 ↗
20. 10.1088/0957-4484/21/37/37530210.1088/0957-4484/21/37/375302 ↗
21. 10.3762/bjnano.3.6310.3762/bjnano.3.63 ↗
22. 10.1002/anie.20100422010.1002/anie.201004220 ↗
23. 10.1021/nn203134a10.1021/nn203134a ↗
24. 10.1016/0039-6028(85)90273-010.1016/0039-6028(85)90273-0 ↗
25. 10.1016/0022-0728(94)03648-M10.1016/0022-0728(94)03648-M ↗
26. 10.1039/b610573d10.1039/b610573d ↗
27. 10.1017/S143192761006256210.1017/S1431927610062562 ↗
28. 10.1088/1742-6596/126/1/01202510.1088/1742-6596/126/1/012025 ↗
29. 10.1063/1.208530710.1063/1.2085307 ↗
30. 10.1021/nn201517r10.1021/nn201517r ↗
31. 10.1063/1.370115310.1063/1.3701153 ↗
32. 10.1063/1.220699610.1063/1.2206996 ↗
33. 10.1088/0957-4484/20/37/37200110.1088/0957-4484/20/37/372001 ↗
34. 10.1088/0022-3727/45/22/22530610.1088/0022-3727/45/22/225306 ↗
35. 10.1021/nn204237h10.1021/nn204237h ↗
36. 10.1088/0957-4484/19/48/48530210.1088/0957-4484/19/48/485302 ↗
37. 10.1002/adma.20120193710.1002/adma.201201937 ↗
38. 10.1039/c1nr10026b10.1039/c1nr10026b ↗
39. 10.1116/1.58602710.1116/1.586027 ↗
40. 10.1002/pssa.20052129210.1002/pssa.200521292 ↗
41. 10.1088/0957-4484/17/15/02810.1088/0957-4484/17/15/028 ↗
42. 10.1116/1.325355110.1116/1.3253551 ↗
43. 10.1063/1.355977310.1063/1.3559773 ↗
44. 10.1088/0957-4484/23/18/18570210.1088/0957-4484/23/18/185702 ↗
45. 10.1116/1.362231410.1116/1.3622314 ↗
46. 10.1109/TED.2011.217021610.1109/TED.2011.2170216 ↗