journal article·2016-01-12

Understanding Controls on Wetting at Fluorinated Polyhedral Oligomeric Silsesquioxane/Polymer Surfaces

Yi Ye, Ming Tian, Chen Zhang, Zhongjie Du, Jianguo Mi

Langmuir· Volume 32· Issue 1
Publisher page

Abstract

Fluorinated polyhedral oligomeric silsesquioxane (F-POSS) nanoparticles have been widely used to enhance the hydrophobicity or oleophobicity of polymer films via constructing the specific micro/nanoscale roughness. In this work, we study the oleophobicity of pure and F-POSS-decorated poly(vinylidene fluoride) (PVDF) and poly(methyl methacrylate) (PMMA) films using a dynamic density functional theory approach. The role of nanoparticle size and coverage and the chemical features of F-POSS and the polymer film in the wetting behavior of diiodomethane droplets has been integrated to the remaining ratio of surface potential to quantitatively characterize the corner effect. It is shown that, on the basis of universal force field parameters, the theoretically predicted contact angles are in general agreement with the available experimental data.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Surface Modification and Superhydrophobicity · Adhesion, Friction, and Surface Interactions · Silicone and Siloxane Chemistry

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

State Key Laboratory of Organic−Inorganic Composites and ‡The Key Laboratory of Carbon Fiber and Functional Polymers, Ministry of Education, Beijing University of Chemical Technology, Beijing 100029, China

Funding

National Natural Science Foundation of China

References (60)

Show source-provided references
1. 10.1039/b602486f10.1039/b602486f ↗
2. 10.1146/annurev.matsci.38.060407.13245110.1146/annurev.matsci.38.060407.132451 ↗
3. 10.1021/cr400169m10.1021/cr400169m ↗
4. 10.1039/C4SM02216E10.1039/C4SM02216E ↗
5. 10.1039/b917112f10.1039/b917112f ↗
6. 10.1002/ange.20070535510.1002/ange.200705355 ↗
7. 10.1039/c3tc31161a10.1039/c3tc31161a ↗
8. 10.1126/science.114832610.1126/science.1148326 ↗
9. 10.1146/annurev.matsci.38.060407.13243410.1146/annurev.matsci.38.060407.132434 ↗
10. 10.1088/0953-8984/20/22/22500910.1088/0953-8984/20/22/225009 ↗
11. 10.1039/c1sm05994g10.1039/c1sm05994g ↗
12. 10.1039/df948030001110.1039/df9480300011 ↗
13. 10.1039/tf944400054610.1039/tf9444000546 ↗
14. 10.1021/ie50320a02410.1021/ie50320a024 ↗
15. 10.1038/nmat253410.1038/nmat2534 ↗
16. 10.1021/la402955e10.1021/la402955e ↗
17. 10.1103/PhysRevLett.104.10610210.1103/PhysRevLett.104.106102 ↗
18. 10.1021/la302127y10.1021/la302127y ↗
19. 10.1063/1.493008410.1063/1.4930084 ↗
20. 10.1080/0001873760010140210.1080/00018737600101402 ↗
21. Binder, K.InKinetics of Phase Transitions;Puri, S.; Wadhawan, V., Eds.CRC Press:Boca Raton, FL, 2009; pp63–99.
22. 10.1039/C3NR06464F10.1039/C3NR06464F ↗
23. 10.1039/f2986820156910.1039/f29868201569 ↗
24. 10.1023/A:102217360026310.1023/A:1022173600263 ↗
25. 10.1103/RevModPhys.81.73910.1103/RevModPhys.81.739 ↗
26. 10.1021/ct300089j10.1021/ct300089j ↗
27. Dietrich, S.; Rauscher, M.; Napiórkowski, M.InNanoscale Liquid Interfaces: Wetting, Patterning and Force Microscopy at the Molecular Scale;Ondarçuhu, T.; Aimé, J.P., Eds.Pan Stanford Publishing Pte. Ltd.:Singapore, 2013; pp83–154.
28. 10.1021/la051946v10.1021/la051946v ↗
29. 10.1039/C4NR06591C10.1039/C4NR06591C ↗
30. 10.1063/1.490112810.1063/1.4901128 ↗
31. 10.1021/la034468210.1021/la0344682 ↗
32. 10.1103/PhysRevLett.100.18610310.1103/PhysRevLett.100.186103 ↗
33. 10.1039/b821214g10.1039/b821214g ↗
34. 10.1016/S0031-8914(37)80203-710.1016/S0031-8914(37)80203-7 ↗
35. 10.1103/PhysRevLett.101.14830210.1103/PhysRevLett.101.148302 ↗
36. 10.1103/PhysRevLett.63.98010.1103/PhysRevLett.63.980 ↗
37. 10.1023/A:102296782097210.1023/A:1022967820972 ↗
38. 10.1063/1.167851310.1063/1.1678513 ↗
39. 10.1021/ma00216a01810.1021/ma00216a018 ↗
40. 10.1039/b107256k10.1039/b107256k ↗
41. 10.1021/ct300180w10.1021/ct300180w ↗
42. 10.1021/ma060577m10.1021/ma060577m ↗
43. 10.1002/9780470141571.ch110.1002/9780470141571.ch1 ↗
44. 10.1063/1.289932910.1063/1.2899329 ↗
45. 10.1103/PhysRevLett.94.08780110.1103/PhysRevLett.94.087801 ↗
46. 10.1063/1.290997510.1063/1.2909975 ↗
47. 10.1021/jp984742e10.1021/jp984742e ↗
48. 10.1016/S0378-3812(98)00216-710.1016/S0378-3812(98)00216-7 ↗
49. 10.1021/jp049459w10.1021/jp049459w ↗
50. 10.1103/PhysRevE.67.04171010.1103/PhysRevE.67.041710 ↗
51. 10.1103/PhysRevE.79.05160210.1103/PhysRevE.79.051602 ↗
52. 10.1039/c3sm52260a10.1039/c3sm52260a ↗
53. 10.1021/jp501683d10.1021/jp501683d ↗
54. 10.1063/1.43977310.1063/1.439773 ↗
55. 10.1063/1.235647010.1063/1.2356470 ↗
56. 10.1098/rsif.2014.028710.1098/rsif.2014.0287 ↗
57. 10.1021/la101616410.1021/la1016164 ↗
58. 10.1140/epje/i2007-10271-710.1140/epje/i2007-10271-7 ↗
59. 10.1021/la700558v10.1021/la700558v ↗
60. 10.1023/B:JMSC.0000004420.65554.1e10.1023/B:JMSC.0000004420.65554.1e ↗