Low Temperature Chemical Vapor Deposition of Cuprous Oxide Thin Films Using a Copper(I) Amidinate Precursor
Source abstract
Abstract
Cuprous oxide (Cu2O) thin films were grown by chemical vapor deposition (CVD) using precursors (N,N′- di-sec-butylacetamidinato)copper(I) and degassed water at low substrate temperatures of 125–225 °C. Despite being a widely studied material, vapor deposition of Cu2O faces numerous challenges in avoiding material agglomeration, in obtaining high phase purity, and in limiting the process temperature to below 200 °C for temperature sensitive applications. We deposited pinhole-free single-phase oxide films that exhibit Hall mobilities up to 17 cm2 V–1 s–1 and wide band gaps exceeding 2.6 eV that are free from contaminants such as nitrogen, carbon, and cupric oxide (CuO). With good control of growth parameters (source temperature, substrate temperature, and flow rate of carrier gas, etc.), the film morphologies could be tuned to achieve either smooth, pinhole-free coatings or highly crystalline thin films with rough surfaces that are suitable for applications to solar cells.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Copper-based nanomaterials and applications · ZnO doping and properties · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
John A. Paulson School of Engineering and Applied Sciences, Harvard University, 29 Oxford Street, Cambridge, Massachusetts 02138, United States
Center for Educational Research, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul 08826, Korea
Department of Chemistry and Chemical Biology, Harvard University, 12 Oxford Street, Cambridge, Massachusetts 02138, United States
Funding
Office of Science · U.S. Department of Energy · National Science Foundation · Harvard?s X-ray laboratory
References (37)
Show source-provided references
1. 10.1063/1.302653910.1063/1.3026539 ↗
2. 10.1016/j.vacuum.2017.04.03310.1016/j.vacuum.2017.04.033 ↗
3. 10.1016/j.tsf.2016.10.00510.1016/j.tsf.2016.10.005 ↗
4. 10.1002/adma.20140105410.1002/adma.201401054 ↗
5. 10.1063/1.490640510.1063/1.4906405 ↗
6. 10.1016/j.materresbull.2012.10.04410.1016/j.materresbull.2012.10.044 ↗
7. 10.1016/j.jcrysgro.2011.01.07110.1016/j.jcrysgro.2011.01.071 ↗
8. 10.1016/0379-6787(85)90018-310.1016/0379-6787(85)90018-3 ↗
9. 10.1016/S0927-0248(00)00036-210.1016/S0927-0248(00)00036-2 ↗
10. 10.1016/j.jcis.2013.05.05910.1016/j.jcis.2013.05.059 ↗
11. 10.1186/1556-276X-6-57510.1186/1556-276X-6-575 ↗
12. 10.1016/0257-8972(95)02415-810.1016/0257-8972(95)02415-8 ↗
13. 10.1007/BF0032473110.1007/BF00324731 ↗
14. 10.1039/C5RA05635G10.1039/C5RA05635G ↗
15. 10.1002/pssa.20112749310.1002/pssa.201127493 ↗
16. 10.1149/1.162735010.1149/1.1627350 ↗
17. 10.1557/PROC-564-25710.1557/PROC-564-257 ↗
18. 10.1143/JJAP.37.409910.1143/JJAP.37.4099 ↗
19. 10.1021/ic048492u10.1021/ic048492u ↗
20. 10.1021/ac60131a04510.1021/ac60131a045 ↗
21. 10.1143/APEX.4.06230110.1143/APEX.4.062301 ↗
22. 10.1063/1.358981010.1063/1.3589810 ↗
23. 10.1016/S0013-4686(00)00434-510.1016/S0013-4686(00)00434-5 ↗
24. 10.1021/jp983787c10.1021/jp983787c ↗
25. 10.1002/ejic.20120138210.1002/ejic.201201382 ↗
26. 10.1021/acscatal.6b0020510.1021/acscatal.6b00205 ↗
27. 10.1016/0022-3093(72)90194-910.1016/0022-3093(72)90194-9 ↗
28. 10.1016/S0040-6090(01)01216-010.1016/S0040-6090(01)01216-0 ↗
29. 10.1016/j.solmat.2011.05.04710.1016/j.solmat.2011.05.047 ↗
30. 10.1088/0031-8949/84/06/06560210.1088/0031-8949/84/06/065602 ↗
31. 10.1016/j.egypro.2013.12.00910.1016/j.egypro.2013.12.009 ↗
32. 10.1021/acs.jpcc.5b1154010.1021/acs.jpcc.5b11540 ↗
33. 10.1016/0031-8914(67)90062-610.1016/0031-8914(67)90062-6 ↗
34. Biccari, F. Defects and Doping in Cu2O. Ph.D. Thesis, Sapienza—University of Rome, Italy, 2012.
35. 10.1016/0038-1098(82)90160-010.1016/0038-1098(82)90160-0 ↗
36. 10.1143/JPSJ.66.218510.1143/JPSJ.66.2185 ↗
37. 10.1139/p83-18210.1139/p83-182 ↗