journal article·2026-05-12

Electron Backscatter Diffraction for Quantitative Evaluation of Copper Surface Cleanliness before Hybrid Bonding

Jit Dutta, Cheng-Hsuan Kuo, Dipayan Pal, Ping-Che Lee, Diego Contreras Mora, Hyeokin Ko, Shuran Sheng, Raymond Hung, Carl V. Thompson, Andrew C. Kummel

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Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Copper Interconnects and Reliability · Corrosion Behavior and Inhibition

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Affiliations

Department of Chemistry, University of California, 9500 Gilman Dr, La Jolla, San Diego, California 92093, United States

Materials Science and Engineering Program, University of California, 9500 Gilman Dr, La Jolla, San Diego, California 92093, United States

Applied Materials, Inc. 8 Upper Changi Road North, Singapore 506906, Singapore

Department of Materials Science and Engineering, MIT, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States

Funding

Microelectronics Advanced Research Corporation

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