Preparation of epitaxially grown LaSrCoO3 thin films on SrTiO3(100) substrates by the dipping-pyrolysis process

LaSrCoO3 thin films were spin-coated onto SrTiO3(100) substrates by the dipping-pyrolysis process. X-ray diffraction θ-2θ scans and X-ray diffraction β scans were used to determine the crystallinity and in-plane alignment behavior of the films. The X-ray diffraction pattern shows the film obtained by annealing at 800°C was highly oriented. The X-ray diffraction pole-figure analysis and reciprocal-space mapping (ω-2θ scans) of the resulting film showed that the film comprising the pseudocubic phase had an epitaxial relationship with the SrTiO3 substrate.