Measurement of foil thickness in transmission electron microscopy
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Abstract
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Crystallography and Radiation Phenomena · Microstructure and mechanical properties
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References (9)
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1. G. W. Lorimer, G. Cliff and J. N. Clark, in “Developments in Electron Microscopy and Analysis” edited by D. L. Misell (Institute of Physics Bristol, 1976) p. 153.
2. P. M. Kelly, A. Jostons, R. G. Blake and J. G. Napier, Phys. Status solidi (a) 31 (1975) 771.10.1002/pssa.2210310251 ↗
3. G. Love, M. G. C. Cox and V. D. Scott, in “Developments in Electron Microscopy and Analysis” edited by D. L. Misell (Institute of Physics, Bristol, 1976) p. 347.
4. W. S. Miller and V. D. Scott, Met. Sci. J. 12 (1978) 95.10.1179/msc.1978.12.2.95 ↗
5. V. D. Scott and G. Love, Mater. Sci. Technol. 3 (1987) 600.10.1179/mst.1987.3.8.600 ↗
6. A. D. Romig and M. J. Carr, “Analytical Electron Microscopy—1984” (San Fransisco Press, San Fransisco, 1984) p. 111.
7. D. A. Rae, V. D. Scott and G. Love, in “Quantitative Microanalysis with High Spatial Resolution” edited by G. W. Lorimer (The Metals Society, London, 1981) p. 57.
8. N. Stenton, M. R. Notis, J. I. Goldstein and D. B. Williams, ibid.in “ p. 35.
9. Y. Kouh and E. L. Hall, General Electric Technical Information, Series 7 Report no. 82 CRD (1982) p. 156.