journal article·1985-11

Alternative analytical forms of the Fuchs-Sondheimer function

C. R. Pichard, M. Bedda, V. I. Vatamanyuk, A. J. Tosser, C. R. Tellier

Journal of Materials Science· Volume 20· Issue 11
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OpenAlex topics: Copper Interconnects and Reliability · Semiconductor materials and devices · Semiconductor materials and interfaces

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References (9)

Show source-provided references
1. C. R. Tellier andA. J. Tosser, ?Size Effects in Thin Films? (Elsevier, New York, 1982) Ch. I.
2. C. R. Tellier, C. R. Pichard andA. J. Tosser,J. Mater. Sci. Lett. 1 (1982) 271.10.1007/BF00727854 ↗
3. E. H. Sondheimer,Adv. Phys. 1 (1952) 1.10.1080/00018735200101151 ↗
4. A. A. Cottey,Thin Solid Films 1 (1967/68) 297.10.1016/0040-6090(68)90047-3 ↗
5. M. Bedda, thesis, Université de Nancy 1 (1985).
6. D. Fuchs,Proc. Cam. Phil. Soc. 34 (1938) 100.10.1017/S0305004100019952 ↗
7. C. R. Tellier, C. R. Pichard andA. J. Tosser,Thin Solid Films 61 (1979) 349.10.1016/0040-6090(79)90480-2 ↗
8. C. R. Tellier,ibid 51 (1978) 53.10.1016/0040-6090(78)90254-7 ↗
9. C. R. Tellier andA. J. Tosser,ibid 52 (1978) 53.10.1016/0040-6090(78)90254-7 ↗