Impact of variable frequency microwave and rapid thermal sintering on microstructure of inkjet-printed silver nanoparticles
Source abstract
Abstract
The effect of thermal profile on microstructure is studied in the frame of thin films deposited by inkjet-printing technology. The role of sintering temperature and thermal ramp is particularly investigated. Fast heating ramps exhibit coarse grains and pores, especially when a hybrid microwave curing is performed. This enhanced growth is attributed to the quick activation of densifying sintering regimes without undergoing thermal energy loss at low temperature. Microstructural evolution of various sintered inkjet-printed films is correlated with electrical resistivity and with the Young’s modulus determined by nanoindentation. A strong link between those three parameters is highlighted during experiments giving credit to either a surface or a fully volumetric sintering, according to the process. Sintering is then mainly triggered by surface mass transfer or by grain boundary diffusion. Silver thin films with an electrical resistivity 4–5 times higher than the bulk, has been reached in a few minutes with a Young’s modulus of 38 GPa.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Nanomaterials and Printing Technologies · nanoparticles nucleation surface interactions · Fluid Dynamics and Thin Films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (22)
Show source-provided references
1. Szczech J, Megaridis C, Gamota D, Zhang J (2002) IEEE Trans Electron Packag Manuf 25:2610.1109/TEPM.2002.1000480 ↗
2. Pekkanen V, Mäntysalo M, Kaija K, Mansikkamäki P, Kunnari E, Laine K, Niittynen J, Koskinen S, Halonen E, Caglar U (2010) Microelectron Eng 87:238210.1016/j.mee.2010.04.013 ↗
3. Kim J-W, Lee Y-C, Kim J-M, Nah W, Lee H-S, Kwon H-C, Jung S-B (2010) Microelectron Eng 87:37910.1016/j.mee.2009.06.012 ↗
4. Castro T, Reifenberger R, Choi E, Andres RP (1990) Phys Rev B 42:854810.1103/PhysRevB.42.8548 ↗
5. Buffat P, Borel J-P (1976) Phys Rev B 13:228710.1103/PhysRevA.13.2287 ↗
6. Alastalo AT, Mattila T, Allen ML, Aronniemi MJ, Leppäniemi JH, Ojanperä KA, Suhonen MP, Seppä H (2008) MRS Proc 1113:F0210.1557/PROC-1113-F02-07 ↗
7. Perelaer J, Klokkenburg M, Hendriks CE, Schubert US (2009) Adv Mater 21:483010.1002/adma.200901081 ↗
8. Chiolerio A, Maccioni G, Martino P, Cotto M, Pandolfi P, Rivolo P, Ferrero S, Scaltrito L (2011) Microelectron Eng 88:248110.1016/j.mee.2010.12.099 ↗
9. Greer JR, Street RA (2007) Acta Mater 55:634510.1016/j.actamat.2007.07.040 ↗
10. Cauchois R, Saadaoui M, Inal K, Dubois-Bonvalot B, Fidalgo J-C (2011) MRS Proc 1335:O0810.1557/opl.2011.1264 ↗
11. Gupta M, Leong E, Wong W (2007) Microwaves and metals. Wiley, Singapore10.1002/9780470822746 ↗
12. Roy R, Agrawal D, Cheng J, Gedevanishvili S (1999) Nature 399:66810.1038/21390 ↗
13. Takayama S, Link G, Miksch S, Sato M, Ichikawa J, Thumm M (2006) Powder Metall 49:27410.1179/174329006X110835 ↗
14. Gabriel C, Gabriel S, Grant EH, Grant EH, Halstead BSJ, Michael D, Mingos P (1998) Chem Soc Rev 27:21310.1039/a827213z ↗
15. Greiser J, Müllner P, Arzt E (2001) Acta Mater 49:104110.1016/S1359-6454(00)00372-4 ↗
16. Frost H, Thompson C, Walton D (1992) Acta Metall Mater 40:77910.1016/0956-7151(92)90020-F ↗
17. Lide D (2000) CRC handbook of chemistry and physics, 81st edn. CRC Press, Boca Raton, p 73
18. Mayadas AF, Shatzkes M (1970) Phys Rev B 1:138210.1103/PhysRevB.1.1382 ↗
19. Chen X, Xiang Y, Vlassak JJ (2006) J Mater Res 21:71510.1557/jmr.2006.0088 ↗
20. Gibson LJ, Ashby MF (1999) Cellular solids: structure and properties, 2nd edn. Cambridge University Press, Cambridge
21. Birnbaum AJ, Wahl KJ, Auyeung RCY, Piqué A (2010) J Micromech Microeng 20:07700210.1088/0960-1317/20/7/077002 ↗
22. Oliver WC, Pharr GM (1992) J Mater Res 7:156410.1557/JMR.1992.1564 ↗