journal article·2009-01

Phase sensitivity of Raman spectroscopy analysis of CVD titania thin films

Song Wei Lu, Caroline Harris, Scott Walck, Mehran Arbab

Journal of Materials Science· Volume 44· Issue 2
Publisher page

Abstract

Photocatalytic titania thin films deposited on float glass by chemical vapor deposition were analyzed by transmission electron microscopy, atomic force microscopy, Raman spectroscopy, and X-ray diffraction. Raman spectroscopy results indicate its phase sensitivity in the presence of trace amount of anatase. This suggests a preferable method of using Raman spectroscopy to characterize mixed phases of titania thin films, especially when titania coatings are deposited on other crystalline oxide materials, for example, tin oxide.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Electronic and Structural Properties of Oxides · TiO2 Photocatalysis and Solar Cells · Quantum Dots Synthesis And Properties

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