journal article·2024-07-23

Thermal Confinement by Monolayer MoS2 for Reduced RESET Current in Phase Change Memory Pillar Cells

Sadid Muneer, Muhammad Aminul Haque Chowdhury, Md. Kabiruzzaman, Shafat Shahnewaz, Nafisa Noor, Mainul Hossain

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Abstract

Phase change memory (PCM) is one of the most promising nonvolatile memory technologies for high-density, high-endurance, fast-switching, and multilevel data storage. However, the high RESET current requirement remains a critical bottleneck in the development of PCM technology. In this work, we propose a pillar-shaped PCM device that consists of a Ge 2 Sb 2 Te 5 (GST) layer sandwiched between the top and the bottom TiN electrodes. An atomically thin layer of MoS 2 is grown on top of the oxidized bottom TiN layer. A filament formed through the TiO 2 and MoS 2 layers enables electrical conduction, while the high thermal resistivity of MoS 2 ensures excellent thermal confinement within the GST layer. Finite element simulations show a 91% reduction in RESET current brought about by the filament, while the use of MoS 2 yields a further ∼30% decrease in the switching power. The results presented here demonstrate the potential use of two-dimensional (2D) materials with conventional PCM cells to reduce switching power.
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Research context

OpenAlex topics: Phase-change materials and chalcogenides · Advanced Memory and Neural Computing · Chalcogenide Semiconductor Thin Films

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Electrical and Electronic Engineering, United International University, United City, Madani Avenue, Badda, Dhaka-1212, Bangladesh

Department of Electrical and Electronic Engineering, University of Dhaka, Dhaka-1000, Bangladesh

Department of Electrical and Electronic Engineering, American International University−Bangladesh, 408/1, Kuratoli, Khilkhet, Dhaka-1229, Bangladesh

Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, Virginia 22904, United States

Department of Electrical and Computer Engineering, North South University, Bashundhara, Dhaka-1229, Bangladesh

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