journal article·1999-01

In-situ high temperature X-ray diffraction study of Ni/SiC interface reactions

T. Fujimura, S.-I. Tanaka

Journal of Materials Science· Volume 34· Issue 2
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Abstract

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Research context

OpenAlex topics: Semiconductor materials and interfaces · Advanced ceramic materials synthesis · Intermetallics and Advanced Alloy Properties

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References (16)

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