journal article·2026-03Open access

Novel test method to measure time-cure superposition shift factors of filled-thermoset under isocure testing conditions

Sukrut Prashant Phansalkar, Bongtae Han

Journal of Materials Science· Volume 61· Issue 10

Abstract

Abstract Despite the solid theoretical foundation of time-cure superposition, the time-cure superposition (TCS) shift factors reported in the literature do not support the theory very well. The discrepancy stems from the non - isocure test conditions used in the tests. This study proposes a novel method to eliminate the inherent problems of existing techniques to measure the TCS shift factors, i.e., to measure them under isocure test conditions. The proposed method optimizes a test procedure while offering sufficient relaxation but producing no or negligible additional curing during testing. Optimization requires a complete understanding of curing behavior not only in the chemically-controlled domain but also in the diffusion-controlled domain. The method is implemented for an epoxy-based molding compound. Portions of the storage master curves are obtained at four partially-cured states $$(p = 0.6, 0.7, 0.8, 0.9)$$ , and they are normalized by the corresponding equilibrium modulus. The normalized curves are subsequently shifted to determine the TCS shift factors using the master curve of fully-cured specimen as a reference. The results show excellent overlaps over the entire curing range after shifting, corroborating that the proposed method is accurate and effective. Validity of the time-cure superposition and applicability of the time–temperature superposition to partially-cured specimens are also confirmed using the test data used to determine the TCS shift factors as well as additional test data.
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Research context

OpenAlex topics: Epoxy Resin Curing Processes · Photopolymerization techniques and applications · Synthesis and properties of polymers

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References (32)

Show source-provided references
1. Chao S, Liaw Y, Chou J-H (2021) The effects of filler shape, type, and size on the properties of encapsulation molding components. Electronics 10:9810.3390/electronics10020098 ↗
2. Liaw Y, Chou J-H (2017) The effects of silica fillers on the properties of encapsulation molding compounds. J Electron Packag 139:03100710.1115/1.4037145 ↗
3. Sinnadurai N (2006) Advanced fillers for electronics encapsulation and electro-magnetic compatibility (EMC), In: 56th Electronic Components and Technology Conference, 2006: IEEE, p. 6
4. Phansalkar SP, Jang Y, Han B (2025) On the assumption used for the time-dependent warpage analysis of encapsulated semiconductor packages. J Electron Packag 147:03100710.1115/1.4068884 ↗
5. Phansalkar SP, Han B (2025) Measurement of temperature-dependent viscoelastic compressibility of highly-filled thermosets using inert gas pressure. J Mech Phys Solids 199:10608710.1016/j.jmps.2025.106087 ↗
6. Lee HS, Sun Y, Kim C, Han B (2018) Characterization of linear viscoelastic behavior of epoxy molding compound subjected to uniaxial compression and hydrostatic pressure. IEEE Trans Compon Packag Manuf Technol 8:1363–137210.1109/TCPMT.2018.2856249 ↗
7. Hosseini S, Akbari S, Shokrieh MM (2021) Numerical and experimental studies of fabrication-induced thermal residual stresses in microelectronic packages. IEEE Trans Compon Packag Manuf Technol 11:755–76410.1109/TCPMT.2021.3070893 ↗
8. Adli AR, Jansen KM (2016) Numerical investigation and experimental validation of residual stresses building up in microelectronics packaging. Microelectron Reliab 62:26–3810.1016/j.microrel.2016.03.015 ↗
9. Tsai M-Y, Wang C, Hsu C (2006) The effect of epoxy molding compound on thermal/residual deformations and stresses in IC packages during manufacturing process. IEEE Trans Compon Packag Technol 29:625–63510.1109/TCAPT.2006.880478 ↗
10. Praful P, Bailey C (2025) Warpage in wafer-level packaging: a review of causes, modelling, and mitigation strategies. Front Electron 5:151586010.3389/felec.2024.1515860 ↗
11. Phansalkar SP, Kim C, Han B (2022) Effect of critical properties of epoxy molding compound on warpage prediction: a critical review. Microelectron Reliab 130:11448010.1016/j.microrel.2022.114480 ↗
12. Zhang X et al. (2021), Addressing warpage issue and reliability challenge of fan-out wafer-level packaging (FOWLP), in 2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2021: IEEE, pp. 1984–199010.1109/ECTC32696.2021.00313 ↗
13. Vardaman EJ (2019), FO‐WLP market and technology trends, Advances in Embedded and Fan‐Out Wafer‐Level Packaging Technologies, pp. 39–5410.1002/9781119313991.ch2 ↗
14. Adolf D, Martin JE (1990) Time-cure superposition during crosslinking. Macromolecules 23:3700–370410.1021/ma00217a026 ↗
15. Sadeghinia M, Jansen KM, Ernst LJ (2012) Characterization of the viscoelastic properties of an epoxy molding compound during cure. Microelectron Reliab 52:1711–171810.1016/j.microrel.2012.03.025 ↗
16. Sadeghinia M, Jansen K, Ernst L (2012) Characterization and modeling the thermo-mechanical cure-dependent properties of epoxy molding compound. Int J Adhes Adhes 32:82–8810.1016/j.ijadhadh.2011.10.007 ↗
17. Jansen K, Hawryluk M, Gromala P (2011) Cure dependent characterisation of moulding compounds, In: 2011 12th Intl. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2011: IEEE, pp. 1/6–6/610.1109/ESIME.2011.5765757 ↗
18. De Vreugd J, Jansen KM, Ernst LJ, Bohm C (2010) Prediction of cure induced warpage of micro-electronic products. Microelectron Reliab 50:910–91610.1016/j.microrel.2010.02.028 ↗
19. Jansen KM et al (2009) Modeling and characterization of molding compound properties during cure. Microelectron Reliab 49:872–87610.1016/j.microrel.2009.03.007 ↗
20. Yang D-G et al (2007) Numerical modeling of warpage induced in QFN array molding process. Microelectron Reliab 47:310–31810.1016/j.microrel.2006.09.036 ↗
21. Phansalkar SP (2025) Mold process induced residual stress prediction using cure extent dependent viscoelastic behavior, PhD Dissertation, Mechanical Engineering Department, University of Maryland, 2024; Also S. P. Phansalkar and B. Han, “Characterization of Young’s and bulk equilibrium modulus evolution of filled-thermoset during curing,” Mechanics of Materials (Submitted for publication), December 2025
22. Saseendran S, Wysocki M, Varna J (2017) Evolution of viscoelastic behaviour of a curing LY5052 epoxy resin in the rubbery state. Adv Compos Mater 26:553–56710.1080/09243046.2017.1310076 ↗
23. Saseendran S, Wysocki M, Varna J (2016) Evolution of viscoelastic behavior of a curing LY5052 epoxy resin in the glassy state. Adv Manuf: Polym Compos Sci 2:74–82
24. Brinson HF, Brinson LC (2015) Polymer engineering science and viscoelasticity. Springer, Berlin10.1007/978-1-4899-7485-3 ↗
25. Phansalkar SP, Mittakolu R, Han B, Kim T (2025) Enhanced DMA test procedure to measure viscoelastic properties of epoxy-based molding compound: multiple oscillatory strain amplitudes and monotonic loading. Micromachines 16:38410.3390/mi16040384 ↗
26. Adolf DB, Martin JE, Chambers RS, Burchett SN, Guess TR (1998) Stresses during thermoset cure. J Mater Res 13:530–55010.1557/JMR.1998.0069 ↗
27. Saseendran S, Wysocki M, Varna J (2017) Cure-state dependent viscoelastic Poisson’s ratio of LY5052 epoxy resin. Adv Manuf: Poly Compos Sci 3:92–100
28. Schawe J (2002) A description of chemical and diffusion control in isothermal kinetics of cure kinetics. Thermochim Acta 388:299–31210.1016/S0040-6031(02)00041-2 ↗
29. Phansalkar SP, Han B (2024) Deterministic approach to obtain autocatalytic cure kinetics model constants by normal equations of least-squares method. IEEE Trans Compon Packag Manuf Technol. https://doi.org/10.1109/TCPMT.2024.338213310.1109/TCPMT.2024.3382133 ↗
30. Tao R, Phansalkar SP, Forster AM, Han B (2023) Investigation of cure kinetics of advanced epoxy molding compound using dynamic heating scan: An overlooked second reaction, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), 2023: IEEE, pp. 1319–132610.1109/ECTC51909.2023.00225 ↗
31. Pascault J, Williams R (1990) Glass transition temperature versus conversion relationships for thermosetting polymers. J Polym Sci B Polym Phys 28:85–9510.1002/polb.1990.090280107 ↗
32. Williams ML, Landel RF, Ferry JD (1955) The temperature dependence of relaxation mechanisms in amorphous polymers and other glass-forming liquids. J Am Chem Soc 77:3701–370710.1021/ja01619a008 ↗