journal article·2023-11-28Open access

Large Sign Reversal of Tunneling Magnetoresistance in an Epitaxial Fe/MgAlOx/Fe4N Magnetic Tunnel Junction

Tianyi Ma, Yu Zhu, Pambiang Abel Dainone, Tongxin Chen, Xavier Devaux, Caihua Wan, Sylvie Migot, Gwladys Lengaigne, Michel Vergnat, Yu Yan, Xiufeng Han, Yuan Lu

ACS Applied Electronic Materials· Volume 5· Issue 11

Abstract

A sign-reversible tunneling magnetoresistance (TMR) bestows an extra control freedom to design TMR-based spintronic devices for developing spin-logic applications. Here, we demonstrate a large sign reversal of TMR in an epitaxial Fe/MgAlO x /Fe 4 N magnetic tunnel junction (MTJ) controlled by the bias voltage. At room temperature (RT), the TMR is measured as large as −26.7% (−38% under optimistic definition) at V = +0.45 V, and it changes the sign to be +3.2% at V = −0.6 V. The TMR sign-reversal effect is doubled compared to those of the Fe/MgO/Fe 4 N MTJs, which is attributed to the better lattice mismatch between Fe 4 N and MgAlO x as well as less N diffusion inside the tunneling barrier. First-principles calculations reveal that the change of the TMR sign originates from different symmetry-dependent tunneling channels between Fe and Fe 4 N electrodes under opposite bias voltages. The Fe/MgAlO x /Fe 4 N MTJ with voltage-controllable TMR signs and relatively large TMR ratios at RT will promote the development of versatile and reprogrammable spin-logic applications.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Magnetic properties of thin films · Semiconductor materials and devices · Ferroelectric and Negative Capacitance Devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100190, China

Institut Jean Lamour, Université de Lorraine, CNRS, UMR 7198, Nancy 54011, France

Key Laboratory of Physics and Technology for Advanced Batteries, Department of Physics, Jilin University, Changchun 130012, China

Funding

Agence Nationale de la Recherche

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